IMP logo
IMP Reference Guide  develop.d3e3923077,2019/12/11
The Integrative Modeling Platform
IMP.pmi.restraints.em2d Namespace Reference

Restraints for handling electron microscopy images. More...

Detailed Description

Restraints for handling electron microscopy images.

Classes

class  ElectronMicroscopy2D
 Fit particles against a set of class averages by principal components. More...
 
class  ElectronMicroscopy2D_FFT
 FFT based image alignment, developed by Javier Velazquez-Muriel. More...