|
IMP Reference Guide
develop.169ea894ba,2025/11/01
The Integrative Modeling Platform
|
Fit particles against a set of class averages by principal components. More...
Fit particles against a set of class averages by principal components.
Compares how well the principal components of the segmented class average fit to the principal components of the particles.
Public Member Functions | |
| def | __init__ |
| Constructor. More... | |
| def IMP.pmi.restraints.em2d.ElectronMicroscopy2D.__init__ | ( | self, | |
| hier, | |||
| images, | |||
| pixel_size, | |||
| image_resolution, | |||
| projection_number, | |||
| resolution, | |||
micrographs_number = None, |
|||
n_components = 1 |
|||
| ) |
Constructor.
| hier | The root hierarchy for applying the restraint |
| images | 2D class average filenames in PGM text format |
| pixel_size | Pixel size in angstroms |
| image_resolution | Estimated resolution of the images in angstroms |
| projection_number | Number of projections of the model to generate and fit to images. The lower the number, the faster the evaluation, but the lower the accuracy |
| resolution | Which level of model representation to use in the fit |
| micrographs_number | Number of micrograph particles that were used to generate the class averages, if known |
| n_components | Number of the largest components to be considered for the EM image |