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IMP Reference Guide
develop.9ab1c4b41a,2026/02/12
The Integrative Modeling Platform
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Restraints for handling electron microscopy maps. More...
Restraints for handling electron microscopy maps.
Classes | |
| class | GaussianEMRestraint |
| Fit Gaussian-decorated particles to an EM map (also represented with a set of Gaussians) More... | |