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IMP Reference Guide  develop.cb469e0f11,2024/05/29
The Integrative Modeling Platform
IMP.pmi1.restraints.em2d.ElectronMicroscopy2D_FFT Class Reference

FFT based image alignment, developed by Javier Velazquez-Muriel. More...

Inherits object.

Detailed Description

FFT based image alignment, developed by Javier Velazquez-Muriel.

This class is only available in Python.

Definition at line 137 of file /restraints/

Public Member Functions

def __init__
 Constructor. More...

Constructor & Destructor Documentation

def IMP.pmi1.restraints.em2d.ElectronMicroscopy2D_FFT.__init__ (   self,
  representation = None,
  images = None,
  pixel_size = None,
  image_resolution = None,
  projection_number = None,
  resolution = None,
  hier = None 


representationDEPRECATED, pass 'hier' instead
imagesSPIDER FORMAT images (format conversion should be done through EM2EM)
pixel_sizesampling rate of the available EM images (angstroms)
image_resolutionresolution at which you want to generate the projections of the model In principle you want "perfect" projections, so use the highest resolution
projection_numberNumber of projections of the model (coarse registration) to estimate the registration parameters
resolutionWhich level of model representation to use in the fit
n_componentsNumber of the largest components to be considered for the EM image
hierThe root hierarchy for applying the restraint

Definition at line 151 of file /restraints/

The documentation for this class was generated from the following file: