IMP.pmi.restraints.em2d.ElectronMicroscopy2D_FFT Class Reference

FFT based image alignment, developed by Javier Velazquez-Muriel. More...

Inherits object.

Detailed Description

FFT based image alignment, developed by Javier Velazquez-Muriel.

Note

This class is only available in Python.

Definition at line 117 of file restraints/em2d.py.

Public Member Functions
def	__init__
	Constructor. More...

Constructor & Destructor Documentation

def IMP.pmi.restraints.em2d.ElectronMicroscopy2D_FFT.__init__	(		self,
			hier,
			images = None,
			pixel_size = None,
			image_resolution = None,
			projection_number = None,
			resolution = None
	)

Constructor.

Parameters

hier	The root hierarchy for applying the restraint
images	SPIDER FORMAT images (format conversion should be done through EM2EM)
pixel_size	sampling rate of the available EM images (angstroms)
image_resolution	resolution at which you want to generate the projections of the model. In principle you want "perfect" projections, so use the highest resolution
projection_number	Number of projections of the model (coarse registration) to estimate the registration parameters
resolution	Which level of model representation to use in the fit

Definition at line 130 of file restraints/em2d.py.

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The documentation for this class was generated from the following file:

• restraints/em2d.py