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    IMP Reference Guide
    2.23.0
    
   The Integrative Modeling Platform 
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Restraints for handling electron microscopy images. More...
Restraints for handling electron microscopy images.
Classes | |
| class | ElectronMicroscopy2D | 
| Fit particles against a set of class averages by principal components.  More... | |
| class | ElectronMicroscopy2D_FFT | 
| FFT based image alignment, developed by Javier Velazquez-Muriel.  More... | |