IMP Reference Guide
2.20.2
The Integrative Modeling Platform
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Restraints for handling electron microscopy images. More...
Restraints for handling electron microscopy images.
Classes | |
class | ElectronMicroscopy2D |
Fit particles against a set of class averages by principal components. More... | |
class | ElectronMicroscopy2D_FFT |
FFT based image alignment, developed by Javier Velazquez-Muriel. More... | |