IMP Reference Guide
2.20.2
The Integrative Modeling Platform
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Restraints for handling electron microscopy maps. More...
Restraints for handling electron microscopy maps.
Classes | |
class | CrossCorrelationRestraint |
Fit particles to an EM map. More... | |
class | GaussianEMRestraint |
Fit Gaussian-decorated particles to an EM map (also represented with a set of Gaussians) More... | |