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IMP Reference Guide  2.20.2
The Integrative Modeling Platform
IMP.pmi1.restraints.em Namespace Reference

Restraints for handling electron microscopy maps. More...

Detailed Description

Restraints for handling electron microscopy maps.

Classes

class  CrossCorrelationRestraint
 Fit particles to an EM map. More...
 
class  GaussianEMRestraint
 Fit Gaussian-decorated particles to an EM map (also represented with a set of Gaussians) More...