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IMP Reference Guide  2.16.0
The Integrative Modeling Platform
IMP.pmi1.restraints.em2d Namespace Reference

Restraints for handling electron microscopy images. More...

Detailed Description

Restraints for handling electron microscopy images.

Classes

class  ElectronMicroscopy2D
 Fit particles against a set of class averages by principal components. More...
 
class  ElectronMicroscopy2D_FFT
 FFT based image alignment, developed by Javier Velazquez-Muriel. More...