IMP.pmi.restraints.em2d.ElectronMicroscopy2D_FFT Class Reference

FFT based image alignment, developed by Javier Velazquez-Muriel. More...

Inherits object.

Detailed Description

FFT based image alignment, developed by Javier Velazquez-Muriel.

Note

This class is only available in Python.

Definition at line 137 of file restraints/em2d.py.

Public Member Functions
def	__init__
	Constructor. More...

Constructor & Destructor Documentation

def IMP.pmi.restraints.em2d.ElectronMicroscopy2D_FFT.__init__	(		self,
			representation = None,
			images = None,
			pixel_size = None,
			image_resolution = None,
			projection_number = None,
			resolution = None,
			hier = None
	)

Constructor.

Parameters

representation	DEPRECATED, pass 'hier' instead
images	SPIDER FORMAT images (format conversion should be done through EM2EM)
pixel_size	sampling rate of the available EM images (angstroms)
image_resolution	resolution at which you want to generate the projections of the model In principle you want "perfect" projections, so use the highest resolution
projection_number	Number of projections of the model (coarse registration) to estimate the registration parameters
resolution	Which level of model representation to use in the fit
n_components	Number of the largest components to be considered for the EM image
hier	The root hierarchy for applying the restraint

Definition at line 151 of file restraints/em2d.py.

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The documentation for this class was generated from the following file:

• restraints/em2d.py