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IMP Reference Guide  2.6.0
The Integrative Modeling Platform
IMP.pmi.restraints.em2d.ElectronMicroscopy2D_FFT Class Reference

FFT based image alignment, developed by Javier Velazquez-Muriel. More...

Detailed Description

FFT based image alignment, developed by Javier Velazquez-Muriel.

Note
This class is only available in Python.

Definition at line 100 of file em2d.py.

Public Member Functions

def __init__
 Constructor. More...
 

Constructor & Destructor Documentation

def IMP.pmi.restraints.em2d.ElectronMicroscopy2D_FFT.__init__ (   self,
  representation = None,
  images = None,
  pixel_size = None,
  image_resolution = None,
  projection_number = None,
  resolution = None,
  hier = None 
)

Constructor.

Parameters
representationDEPRECATED, pass 'hier' instead
imagesSPIDER FORMAT images (format conversion should be done through EM2EM)
pixel_sizesampling rate of the available EM images (angstroms)
image_resolutionresolution at which you want to generate the projections of the model In principle you want "perfect" projections, so use the highest resolution
projection_numberNumber of projections of the model (coarse registration) to estimate the registration parameters
resolutionWhich level of model representation to use in the fit
n_componentsNumber of the largest components to be considered for the EM image
hierThe root hierarchy for applying the restraint

Definition at line 114 of file em2d.py.


The documentation for this class was generated from the following file: